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Thermal Management Strategies for Low and High Voltage Retrofit LED Lamp Drivers

Several thermal management strategies for LED drivers designed for high lumen retrofit LED lamps are studied by simulation and experimentation means. Depending on the driver output, two scenarios are analyzed: Low Voltage-High Current (18V-620mA) and High Voltage-Low Current (110V-85mA).

https://www.imb-cnm.csic.es/es/node/366

Resistive Switching with Self-Rectifying Tunability and Influence of the Oxide Layer Thickness in Ni/HfO2/n+-Si RRAM Devices

The impact of the dielectric thickness, forming polarity, and current compliance on the self-rectifying current–voltage characteristics of Ni/HfO2/n+-Si RRAM devices has been investigated.

https://www.imb-cnm.csic.es/es/node/367

Impedimetric label-free sensor for specific bacteria endotoxin detection by surface charge registration

An impedimetric sensor based on a three dimensional electrode array modified with consecutive deposition of Con A-glycogen-Con A layers was used for label-free detection of bacterial endotoxin: lipopolysaccharide (LPS) from Escherichia coli.

https://www.imb-cnm.csic.es/es/node/368

Compact Sampling Device Based on Wax Microfluidics

This work reports on the design, fabrication and performance of a low-cost, self-contained sampling device based on a wax microfluidics technology. This sampler delivers leak- and contamination-free performance that ensures the integrity of the collected samples.

https://www.imb-cnm.csic.es/es/node/369

Àrea d'Exhibició Microelectrònica Zenon Navarro

L'Àrea d'Exhibició Microelectrònica Zenon Navarro té equips utilitzats per al disseny, fabricació i mesura de dispositius electrònics.

https://www.imb-cnm.csic.es/es/noticias-divulgacion/divulgacion/area-de-exhibicion-microelectronica-zenon-navarro

Zenon Navarro Microelectronics Exhibition Area

The Zenon Navarro Microelectronics Exhibition Area displays equipment used for the design, fabrication and measurement of electronic devices.

https://www.imb-cnm.csic.es/es/noticias-divulgacion/divulgacion/area-de-exhibicion-microelectronica-zenon-navarro

Área de Exhibición Microelectrónica Zenon Navarro

El Área de Exhibición Microelectrónica Zenon Navarro exhibe al público equipos utilizados para el diseño, fabricación y medición de dispositivos electrónicos.

https://www.imb-cnm.csic.es/es/noticias-divulgacion/divulgacion/area-de-exhibicion-microelectronica-zenon-navarro

Highly Anisotropic Suspended Planar-Array Chips with Multidimensional Sub-Micrometric Biomolecular Patterns

The physical and chemical properties of silicon chips can be tuned to address the requirements of the research. The control of the physical anisotropy from fabrication allows obtaining chips with the desired aspect ratio, branching, faceting and size.

https://www.imb-cnm.csic.es/es/node/370

Thermal Phase Lag Heterodyne Infrared Imaging for Radio Frequency Integrated Circuits Performance Degradation Analysis

With thermal phase lag measurements, current paths are tracked in a Class A Radio Frequency (RF) power amplifier at 2 GHz. The phase lag maps evidence with a higher sensitivity than thermal amplitude measurements, an input-output loop due to a substrate capacitive coupling.

https://www.imb-cnm.csic.es/es/node/371

P-GaN HEMTs Drain and Gate Current Analysis under Short-Circuit

Gallium Nitride High-Electron-Mobility Transistors (GaN HEMTs) are promising devices for high-frequency and high-power density converters, but some of their applications (e.g., motor drives) require high robustness levels.

https://www.imb-cnm.csic.es/es/node/372