Power Devices Electrical Characterization Laboratory

The main activities performed in the Power Devices Electrical Characterization Laboratory are:

• Electrical validation of new power devices developed in the Clean Room.
• Electrical analysis of commercial power devices.
• Development of new techniques for electrical characterization.
• Development of integrated power systems. 

• Steady-state electrical characterization of power devices at different temperatures: 

1. Voltage-Current curves (forward and blocking)
2. Electrical parameters extraction (on-resistance, threshold voltage, etc.).
3. Capacitance-Voltage curves
4. Calibration of temperature sensitive parameters (up to 400ºC)
5. On-wafer mapping with semi-automatic probe stations

• Dynamic electrical characterization of power devices at different temperatures:

1. Switching tests and dynamic parameters extraction (turn-on and turn-off times, switching losses, etc.).

• Reliability/ruggedness testing of power devices:

1. Surge current test
2. Power cycling
3. Short-circuit capability

• Integrated power systems development:

1. Assembly of integrated power systems (power modules).
2. Optical inspection of integrated power systems (metallization analysis, etc.).
3. Development of specific measurement systems (switching boards, etc.).

• Development and production of probe cards for automatic on-wafer mapping of power devices.

• Static characterization of power devices:

1. Semiautomatic wafer probers with hot chuck (300ºC)
2. Source-measurement units (up to 12kV and 10A)
3. CV measurement equipment
4. Curve tracers (up to 3300 V – 400 A)
5. Instrumentation controllers (GPIB bus)

• Dynamic characterization of components:

1. Switching times (Double Pulse Test)
2. Power switching losses (Double Pulse Test)
3. Short-circuit characterization
4. Gate driving characteristics)
5. Parasitic capacitances extraction (up to 800 V)

• Surge and ESD characterization equipment
• Equipment for the design, development and characterization of power systems