Skip to main content

Power Devices Electrical Characterization Laboratory

The Power Devices Electrical Characterization Laboratory covers the main needs of the Power Devices and Systems research group of IMB-CNM in terms of electrical assessment of the power devices developed in the Clean Room. In addition, it is also open for industrial and/or academic collaborations such as the characterization of commercial devices under specific conditions not provided in datasheets.

Main activities

The main activities performed in the Power Devices Electrical Characterization Laboratory are:

  • Electrical validation of new power devices developed in the Clean Room.
  • Electrical analysis of commercial power devices.
  • Development of new techniques for electrical characterization.
  • Development of integrated power systems. 

Techniques

  • Steady-state electrical characterization of power devices at different temperatures: 
  1. Voltage-Current curves (forward and blocking)
  2. Electrical parameters extraction (on-resistance, threshold voltage, etc.).
  3. Capacitance-Voltage curves
  4. Calibration of temperature sensitive parameters (up to 400ºC)
  5. On-wafer mapping with semi-automatic probe stations
  • Dynamic electrical characterization of power devices at different temperatures:
  1. Switching tests and dynamic parameters extraction (turn-on and turn-off times, switching losses, etc.).
  • Reliability/ruggedness testing of power devices:
  1. Surge current test
  2. Power cycling
  3. Short-circuit capability
  • Integrated power systems development:
  1. Assembly of integrated power systems (power modules).
  2. Optical inspection of integrated power systems (metallization analysis, etc.).
  3. Development of specific measurement systems (switching boards, etc.).
  • Development and production of probe cards for automatic on-wafer mapping of power devices.

Equipment

  • Static characterization of power devices:
  1. Semiautomatic wafer probers with hot chuck (300ºC)
  2. Source-measurement units (up to 12kV and 10A)
  3. CV measurement equipment
  4. Curve tracers (up to 3300 V – 400 A)
  5. Instrumentation controllers (GPIB bus)
  • Dynamic characterization of components:
  1. Switching times (Double Pulse Test)
  2. Power switching losses (Double Pulse Test)
  3. Short-circuit characterization
  4. Gate driving characteristics)
  5. Parasitic capacitances extraction (up to 800 V)
  • Surge and ESD characterization equipment
  • Equipment for the design, development and characterization of power systems

Contact person