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Institute of Microelectronics of Barcelona IMB-CNM   

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Micro and Nanotechnology research for you

IMB-CNM talks: Reliability testing methodology and lifetime modelling - Prof. Zoubir Khatir

Sala de Actos Pepe Millán, IMB-CNM, Campus UAB.
16/10/2018 12:00 a.m.

Abstract: Lifetime reliability testing of power electronic devices by using power cycling tests is required to build up lifetime models. With them, the power devices remaining useful lifetime can be assesed to practice predictive maintenance. In this sense, recent experimental works carried out at IFSTTAR will be presented, such as reliability testing methodologies, aging strategies, methods for failure mechanisms separation, and cumulative degradation assessment. Some specific results on WBG devices (GaN HEMTs) will be described. Finally, modeling aspects will be discussed, like building lifetime models based on electro-thermo-mechanical stresses and material degradations.

Full Review William Hill