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Micro and Nanotechnology research for you

SEMINAR, Wednesday, 3 May, 12:00, Sala d'Actes Pepe Millán del CNM

“Generation-recombination noise in advanced CMOS and memory devices” Prof. Eddy Simoen Interuniversity Microelectronic Center, IMEC, Leuven, Belgium

Abstract: Generation-Recombination (GR) noise is one of the excess noise sources in semiconductor materials and devices, which originates from successive capture and emission events by a deep-level GR center. The corresponding spectrum is Lorentzian, with a plateau at low frequencies and a 1/f2 roll of beyond the corner frequency fc. In MOSFETs, at least two types of GR noise can be distinguished: the first type has a corner frequency that does not chance with gate bias, while for the second case, there is a pronounced dependence. It is believed that the first type of GR centers resides in the depletion region, while oxide traps originate the second type of spectra. They are better known as Random Telegraph Noise (RTN).
In the seminar, it will be outlined how in both cases information can be gathered regarding the deep level parameters. For depletion region traps, studying fc as a function of temperature allows performing GR noise spectroscopy, which leads to the identification of several processing-induced defects in Fully Depleted Silicon-on-Insulator (FDSOI) nMOSFETs, Ge pMOSFETs and InGaAs nMOSFETs. In the case of RTN, there are several ways to derive information on the underlying oxide trap parameters. This can be based on time- or frequency domain studies. In scaled devices, RTN can be generated by defects in the gate oxide or in the semiconductor. As an example, different types of RTN in vertical polysilicon nMOSFETs for Non-Volatile Memories will be discussed. It will be outlined how information on the trap location along ad in the channel can be derived.

Eddy Simoen is a senior researcher at imec since 1986 and a part-time Guest Professor at Ghent University since 2012. He is a Fellow of the ECS since 2016 and the current Chair of the IEEE Electron Devices Society (EDS) of the Benelux. His field of research covers the impact of defects on semiconductor materials and device performance, low-frequency noise and Deep-Level Transient Spectroscopy of semiconductors. He has published over 1600 technical papers and conference contributions and 5 books and several book chapters.

Science Week in November

During the Science Week in November, the "Zenon Navarro" Microelectronics Museum Space of IMB-CNM will be open for visits.

The 21th Science Week in Catalonia will be held from 11th to 20nd November, and the Science and Technology Week at CSIC will be held during all November.

IMB-CNM will have “Open Doors” at the Zenon Navarro Museum Space from 14th to 18th November, from 10 h to 13 h and from 15 h to 17 h.

Group visits (more than 10 persons) require a reservation (please contact: This email address is being protected from spambots. You need JavaScript enabled to view it.).

OPEN ACCESS Seminar

Wednesday 11 May 2016 at 12h, Sala d’Actes, Institut de Microelectrònica de Barcelona, IMB-CNM-CSIC

 

Ignasi Labastida
Centre de Recursos per a l'Aprenentatge i la Investigació (CRAI), Universitat de Barcelona

Currently "Open access" has become a common word for researchers especially when publishing: "Should I publish in an open access journal?", "Should I choose the open access option?" Moreover research funding agencies and research institutions are adopting open access policies requiring providing public access to research outputs, but researchers are still wondering when, where or how. New words as repositories, embargoes, post-prints or APC appear in this entire field, leading, sometimes, to misunderstandings and errors. In this session we will try to solve any question and explain how to fulfill to different policies that can affect the dissemination of our research.

 

When: Wednesday 11 May 2016 at 12h
Where: Sala d’Actes, Institut de Microelectrònica de Barcelona, IMB-CNM-CSIC
Campus UAB, Carrer dels Til.lers s/n, 08193 Bellaterra

Registration via e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Science Week in November

During the Science Week in November, the "Zenon Navarro" Microelectronics Museum Space of IMB-CNM will be open for visits.

The 20th Science Week in Catalonia will be held from 13th to 22nd November, and the Science and Technology Week at CSIC will be held during all November.

The Zenon Navarro Museum Space of IMB-CNM will be opened from 16th to 20th November, from 10 h to 13 h and from 15 h to 17 h.

Group visits (more than 10 persons) require a reservation (please contact: This email address is being protected from spambots. You need JavaScript enabled to view it.).

EPoSS Forum

EPoSS will hold its Forum and General Assembly on October 12-15 on “State of the (Sm)Art: Smart Systems Responding to Demand Side Requirements”.
There is a call for Presentations (deadline 14th Aug) and of Posters & Demonstrators (deadline 11th Sep).
It will be a joint event with MNBS 2015.

Visit Smart Systems Integration for more information

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